TY - JOUR
T1 - Observation of interference fringes with a lattice spacing of 1.92 å in convergent-beam electron diffraction
AU - Tsuda, Kenji
AU - Terauchi, Masami
AU - Tanaka, Michiyoshi
AU - Kaneyama, Toshikatsu
AU - Honda, Toshikazu
N1 - Copyright:
Copyright 2010 Elsevier B.V., All rights reserved.
PY - 1994/6
Y1 - 1994/6
N2 - The interference fringes with a lattice spacing of 1.92 Å for the 220 reflection of Si have been observed in convergent-beam electron diffraction patterns using a JEM 2010F electron microscope equipped with a field-emission gun. The fringes observed in the present study have the smallest lattice spacing among the fringes reported to date.
AB - The interference fringes with a lattice spacing of 1.92 Å for the 220 reflection of Si have been observed in convergent-beam electron diffraction patterns using a JEM 2010F electron microscope equipped with a field-emission gun. The fringes observed in the present study have the smallest lattice spacing among the fringes reported to date.
KW - Coherent electron beam
KW - Convergent-beam electron diffraction
KW - Diffracted wave phase
KW - Field-emission gun
KW - Interference fringe
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M3 - Article
AN - SCOPUS:0006194549
VL - 43
SP - 173
EP - 175
JO - Microscopy (Oxford, England)
JF - Microscopy (Oxford, England)
SN - 2050-5698
IS - 3
ER -