Observation of interference fringes with a lattice spacing of 1.92 å in convergent-beam electron diffraction

Kenji Tsuda, Masami Terauchi, Michiyoshi Tanaka, Toshikatsu Kaneyama, Toshikazu Honda

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

The interference fringes with a lattice spacing of 1.92 Å for the 220 reflection of Si have been observed in convergent-beam electron diffraction patterns using a JEM 2010F electron microscope equipped with a field-emission gun. The fringes observed in the present study have the smallest lattice spacing among the fringes reported to date.

Original languageEnglish
Pages (from-to)173-175
Number of pages3
JournalJournal of Electron Microscopy
Volume43
Issue number3
Publication statusPublished - 1994 Jun

Keywords

  • Coherent electron beam
  • Convergent-beam electron diffraction
  • Diffracted wave phase
  • Field-emission gun
  • Interference fringe

ASJC Scopus subject areas

  • Instrumentation

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