Abstract
This paper describes the performance of a scanning nonlinear dielectric microscope when a gap exists between the specimen and the probe of the microscope. First, a theory for the sensitivity of the scanning nonlinear dielectric microscope as a function of the gap height is described. Second, using the microscope in a noncontact mode, an area scan of the polarization of an alternately poled ferroelectric thin film of a copolymer consisting of vinylidene fluoride and trifluoroethylene is carried out.
| Original language | English |
|---|---|
| Pages (from-to) | 360-363 |
| Number of pages | 4 |
| Journal | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
| Volume | 36 |
| Issue number | 1 A |
| DOIs | |
| Publication status | Published - 1997 Jan |
| Externally published | Yes |
Keywords
- Noncontact mode
- Observation of ferroelectric polarization
- Scanning nonlinear dielectric microscope
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)