Observation of domain walls in PbZr0.2 Ti0.8O 3 thin film using scanning nonlinear dielectric microscopy

K. Matsuura, Yasuo Cho, R. Ramesh

Research output: Contribution to journalArticle

20 Citations (Scopus)

Abstract

The observation of domain walls in PbZr0.2Ti0.8O 3 thin film using scanning nonlinear dielectric microscopy was presented. The linear dielectric constant of a domains and c domains was measured. It was found that the 180° c-c domain wall was smaller than the 90° a-c domain wall.

Original languageEnglish
Pages (from-to)2650-2652
Number of pages3
JournalApplied Physics Letters
Volume83
Issue number13
DOIs
Publication statusPublished - 2003 Sep 29

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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