Observation of artificial nano-domains in ferroelectric thin films using nonlinear dielectric imaging and piezo imaging

Kaori Matsuura, Yasuo Cho

Research output: Contribution to journalConference article

1 Citation (Scopus)

Abstract

We have developed scanning nonlinear dielectric microscopy (SNDM) that is the first successful purely electrical method for observing polarization distributions of ferroelectric materials. Now the resolution of SNDM has been improved to sub-nanometer. On the other hand, the piezoelectric response imaging (piezo-imaging) using scanning force microscopy (SFM) is well known as the method for observing the polarization distributions. In this study, we compare the resolution of SNDM with that of the piezo-imaging and confirm that the resolution of SNDM is much higher than that of piezo-imaging. Then, as the fundamental study to apply the SNDM system to a ferroelectric reading-recording system, we switched and observed the ferroelectric domains using the SNDM system.

Original languageEnglish
Pages (from-to)59-67
Number of pages9
JournalIntegrated Ferroelectrics
Volume38
Issue number1-4
DOIs
Publication statusPublished - 2001 Dec 1
Event13th International Symposium on Integrated Ferroelectrics - Colorado Springs, CO, United States
Duration: 2006 Mar 112006 Mar 14

Keywords

  • Nano-domain forming
  • Nonlinear dielectric imaging
  • Piezoelectric response imaging
  • Scanning nonlinear dielectric microscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Control and Systems Engineering
  • Ceramics and Composites
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

Fingerprint Dive into the research topics of 'Observation of artificial nano-domains in ferroelectric thin films using nonlinear dielectric imaging and piezo imaging'. Together they form a unique fingerprint.

Cite this