Abstract
Layer-by-layer films composed of redox-active ruthenium dimer and Zr(IV) ions were fabricated on an indium tin oxide electrode. The fabricating behavior was monitored by cyclic voltammetry and UV-vis absorption spectral measurements. The orientation of the film was also monitored by grazing-incidence small-angle and wide-angle X-ray scattering (GISAXS) measurements, and it has been clarified that this film has a crystalline structure. The peaks obtained by GISAXS were changed upon oxidation reaction, which indicates that a change in the orientation of the ruthenium dimer occurred in the film.
Original language | English |
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Pages (from-to) | 10327-10330 |
Number of pages | 4 |
Journal | Langmuir |
Volume | 31 |
Issue number | 38 |
DOIs | |
Publication status | Published - 2015 Sep 29 |
Externally published | Yes |
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Surfaces and Interfaces
- Spectroscopy
- Electrochemistry