Observation of a local dipole moment of Si atoms on Si(100) surfaces using non-contact scanning nonlinear dielectric microscopy

Nobuhiro Kin, Yuhei Osa, Yasuo Cho

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

To confirm the performance of non-contact scanning nonlinear dielectric microscopy (NC-SNDM), we attempted to determine the local dipole moment of Si atoms on a Si(100) cleaned surface under UHV conditions. In conclusion, we succeeded in confirming the high resolution and reliability of NC-SNDM by observing the typical Si(100) surface structure with atomic resolution. In addition, we observed the local electric dipole moment distribution of Si atoms on a Si(100) 2 × 1 structure and studied the dc-bias voltage dependence of the local dipole moment induced on its surfaces.

Original languageEnglish
Title of host publicationTheory and Applications of Ferroelectric and Multiferroic Materials
Pages108-113
Number of pages6
Publication statusPublished - 2008 Dec 1
Event2008 MRS Fall Meeting - Boston, MA, United States
Duration: 2008 Dec 22008 Dec 5

Publication series

NameMaterials Research Society Symposium Proceedings
Volume1110
ISSN (Print)0272-9172

Other

Other2008 MRS Fall Meeting
Country/TerritoryUnited States
CityBoston, MA
Period08/12/208/12/5

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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