Observation and analysis of defect cluster production and interactions with dislocations

S. J. Zinkle, Y. Matsukawa

Research output: Contribution to journalConference articlepeer-review

173 Citations (Scopus)


The current understanding of defect production fundamentals in neutron-irradiated face centered cubic (FCC) and body centered cubic (BCC) metals is briefly reviewed, based primarily on transmission electron microscope observations. Experimental procedures developed by Michio Kiritani and colleagues have been applied to quantify defect cluster size, density, and nature. Differences in defect accumulation behavior of irradiated BCC and FCC metals are discussed. Depending on the defect cluster obstacle strength, either the dispersed barrier hardening model or the Friedel-Kroupa-Hirsch weak barrier model can be used to describe major aspects of radiation hardening. Irradiation at low temperature can cause a change in deformation mode from dislocation cell formation at low doses to twinning or dislocation channeling at higher doses. The detailed interaction between dislocations and defect clusters helps determine the dominant deformation mode. Recent observations of the microstructure created by plastic deformation of quenched and irradiated metals are summarized, including in situ deformation results. Examples of annihilation of stacking fault tetrahedra by gliding dislocations and subsequent formation of mobile superjogs are shown.

Original languageEnglish
Pages (from-to)88-96
Number of pages9
JournalJournal of Nuclear Materials
Issue number1-3 PART A
Publication statusPublished - 2004 Aug 1
Externally publishedYes
EventProceedings of the 11th Conference on Fusion Research - Kyoto, Japan
Duration: 2003 Dec 72003 Dec 12

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Materials Science(all)
  • Nuclear Energy and Engineering


Dive into the research topics of 'Observation and analysis of defect cluster production and interactions with dislocations'. Together they form a unique fingerprint.

Cite this