Novel approach for structure analysis by x-ray Raman scattering

Kazuyuki Tohji, Yasuo Udagawa

Research output: Contribution to journalArticlepeer-review

54 Citations (Scopus)

Abstract

An oscillation similar to that in extended x-ray absorption fine-structure (EXAFS) measurements was observed in the x-ray Raman spectra of graphite by exciting 8265-eV x rays from synchrotron radiation. From an analysis employing the formula used for EXAFS, the carbon-carbon interatomic distances are obtained which are in good agreement with the known values in graphite. Thus, x-ray Raman scattering by hard x rays is a very promising method for the determination of the local structure around light elements.

Original languageEnglish
Pages (from-to)9410-9412
Number of pages3
JournalPhysical Review B
Volume36
Issue number17
DOIs
Publication statusPublished - 1987 Jan 1
Externally publishedYes

ASJC Scopus subject areas

  • Condensed Matter Physics

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