TY - JOUR
T1 - Nonlocal quantum conduction and the influence of contact resistance in GaAs/AlGaAs wires
AU - Takaoka, S.
AU - Tsukagoshi, K.
AU - Oto, K.
AU - Sawasaki, T.
AU - Murase, K.
AU - Takagaki, Y.
AU - Gamo, K.
AU - Namba, S.
N1 - Funding Information:
We thank S. Nishi of Oki Electric Industry Co., Ltd. and K. Kasaharao f NEC Corp. for providingM BE grownw afers.T his work is supported in part by a Grant-in-Aidf or Scientific Researcho n Priority Area, "ElectronW ave In-terferencEef fectsi n MesoscopicS tructuref"r om the Ministry of EducationS, ciencea nd Culture. One of us (S.T.) acknowledgeths e supportb y the Murata ScienceF oundation.
PY - 1992
Y1 - 1992
N2 - The Shubnikov-de Haas (SdH) effects of multi-terminal GaAs/AlGaAs wires in the nonlocal geometry, where the nominal current path is spatially separated from and does not intersect with the voltage probes, have been measured in the wide range of the seperation length (0.4 μm < ΔL < 1.5 mm) between the current and voltage probes, which will be related to the quantum effect in connection with the edge currents. Further, it is found that the signal of nonlocal SdH resistance becomes even negative, when the contact resistance is very large. This will be explained by the non-equal chemical potentials among the edge currents and the different transmission probabilities of the edge current to the probe due to the selective contact resistance for each edge state.
AB - The Shubnikov-de Haas (SdH) effects of multi-terminal GaAs/AlGaAs wires in the nonlocal geometry, where the nominal current path is spatially separated from and does not intersect with the voltage probes, have been measured in the wide range of the seperation length (0.4 μm < ΔL < 1.5 mm) between the current and voltage probes, which will be related to the quantum effect in connection with the edge currents. Further, it is found that the signal of nonlocal SdH resistance becomes even negative, when the contact resistance is very large. This will be explained by the non-equal chemical potentials among the edge currents and the different transmission probabilities of the edge current to the probe due to the selective contact resistance for each edge state.
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U2 - 10.1016/0039-6028(92)91138-2
DO - 10.1016/0039-6028(92)91138-2
M3 - Article
AN - SCOPUS:0026850564
VL - 267
SP - 282
EP - 285
JO - Surface Science
JF - Surface Science
SN - 0039-6028
IS - 1-3
ER -