Nondestructive Characterization of Silicon Carbide by Impedance Spectroscopy Method

Mikiko Nakajima, Tetsuo Shoji, Hisashi Hasuda

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

A four point bending test was carried out on sintered α-type SiC speciments to examine the scattering of strength. On the other hand, nondestructive material characterization by means of impedance measurement of the specimen for a wide range of frequency of 5 Hz~100 kHz was performed. As a result, it was found that the complex plane plot of the impedance is composed of two semicircles. The diameter of the smaller semicircle (high-frequency side) was almost the same for all specimens, but that of the larger semicircle (low-frequency side) was different between bulk end specimens and bulk center specimens. This impedance variation from specimen to specimen agrees well with those of the bending strength. From the composition analysis of each specimen, it was found that the bending strength and the diameter of the low-frequency semicircle is affected by the content of free carbon assumed to exist at the grain boundaries. Possible evaluation of the material properties of SiC by impedance spectroscopy seems to be promising.

Original languageEnglish
Pages (from-to)940-945
Number of pages6
JournalNihon Kikai Gakkai Ronbunshu, A Hen/Transactions of the Japan Society of Mechanical Engineers, Part A
Volume61
Issue number585
DOIs
Publication statusPublished - 1995
Externally publishedYes

Keywords

  • Bending
  • Bending Strength
  • Ceramic
  • Impedance Spectroscopy
  • Nondestructive Evaluation
  • Reliability
  • Silicon Carbide
  • Sintering Aids

ASJC Scopus subject areas

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

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