Non-optically probing near-field microscopy

Y. Kawata, C. Egami, O. Nakamura, O. Sugihara, N. Okamoto, M. Tsuchimori, O. Watanabe

Research output: Contribution to journalArticlepeer-review

47 Citations (Scopus)

Abstract

We present a near-field optical microscope without the use of a probe for illumination or detection or scattering of the optical fields. In our system the optical fields near specimens are converted to the topographical change of a photosensitive film, and then the topography is detected with an atomic force microscope. Urethane-urea copolymer films are used for the conversion material from the optical fields to the topography. We succeeded in imaging with a resolution higher than 50 nm.

Original languageEnglish
Pages (from-to)6-12
Number of pages7
JournalOptics Communications
Volume161
Issue number1-3
DOIs
Publication statusPublished - 1999

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Physical and Theoretical Chemistry
  • Electrical and Electronic Engineering

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