We present a near-field optical microscope without the use of a probe for illumination or detection or scattering of the optical fields. In our system the optical fields near specimens are converted to the topographical change of a photosensitive film, and then the topography is detected with an atomic force microscope. Urethane-urea copolymer films are used for the conversion material from the optical fields to the topography. We succeeded in imaging with a resolution higher than 50 nm.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Physical and Theoretical Chemistry
- Electrical and Electronic Engineering