Non-invasive EMI-based fault injection attack against cryptographic modules

Yu-Ichi Hayashi, Naofumi Homma, Takeshi Sugawara, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone

Research output: Chapter in Book/Report/Conference proceedingConference contribution

25 Citations (Scopus)

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Physics & Astronomy

Engineering & Materials Science