Noise measurements of a 45-GHz mode-locked laser diode

L. A. Jiang, M. E. Grein, E. P. Ippen, H. A. Haus, T. Shimizu, H. Kurita, H. Yokoyama

Research output: Contribution to conferencePaper

Abstract

The carrier phase noise is measured using a Michelson interferometer and the intensity noise by direct detection of a mode-locked laser diode. Implications for short pulse systems are highlighted.

Original languageEnglish
Pages98-99
Number of pages2
DOIs
Publication statusPublished - 2000 Jan 1
Externally publishedYes
EventConference on Lasers and Electro-Optics (CLEO 2000) - San Francisco, CA, USA
Duration: 2000 May 72000 May 12

Other

OtherConference on Lasers and Electro-Optics (CLEO 2000)
CitySan Francisco, CA, USA
Period00/5/700/5/12

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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  • Cite this

    Jiang, L. A., Grein, M. E., Ippen, E. P., Haus, H. A., Shimizu, T., Kurita, H., & Yokoyama, H. (2000). Noise measurements of a 45-GHz mode-locked laser diode. 98-99. Paper presented at Conference on Lasers and Electro-Optics (CLEO 2000), San Francisco, CA, USA, . https://doi.org/10.1109/cleo.2000.906773