Noise analysis of a 1 MHz–3 GHz magnetic thin film permeance meter

S. Yabukami, M. Yamaguchi, K. I. Arai, M. Watanabe, A. Itagaki, H. Ando

Research output: Contribution to journalArticle

21 Citations (Scopus)

Abstract

We analyzed the permeability measurement error of a low permeance thin film. We clarified that the noise voltage was excited by a current loop which is composed of the coaxial cable and the ground plane. The current loop should be removed for high sensitivity of the permeameter. The permeability of a high electrical resistivity film (CoFeHfO) has been demonstrated 1 MHz–3.5 GHz.

Original languageEnglish
Pages (from-to)5148-5150
Number of pages3
JournalJournal of Applied Physics
Volume85
Issue number8
DOIs
Publication statusPublished - 1999 Apr 15

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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