New technique to measure the polarization dependence of non-resonant X-ray magnetic scattering

H. Ohsumi, M. Mizumaki, S. Kimura, M. Takata, H. Suematsu

Research output: Contribution to journalConference articlepeer-review

3 Citations (Scopus)

Abstract

A new technique to measure the polarization dependence of scattering intensity without using an analyzer crystal has been developed and applied to a magnetic satellite reflection of rare-earth metal dysprosium. We have successfully observed the scattering plane inclination angle θ dependence of satellite peak intensity. The magnetic and charge scattering have definitely different θ dependence of scattering intensity, which enables us to distinguish the scattering origins.

Original languageEnglish
Pages (from-to)258-261
Number of pages4
JournalPhysica B: Condensed Matter
Volume345
Issue number1-4
DOIs
Publication statusPublished - 2004 Mar 1
Externally publishedYes
EventProceedings of the Conference on Polarised Neutron - Venice, Italy
Duration: 2003 Aug 42003 Aug 6

Keywords

  • Dysprosium
  • Non-resonant X-ray magnetic scattering
  • Polarization analysis
  • Tensor scattering factor

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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