Weakness of the holographic undulation, which is about 0.3% in the angular distribution of the X-ray fluorescence intensity, has been a problem of X-ray fluorescence holography (XFH). In order to observe strong holographic undulation, I propose a new XFH technique which combines the normal XFH and inverse XFH, which are equivalent by virtue of the optical reciprocity theorem. This new technique is here termed `mixed XFH'. The performance of the mixed XFH was demonstrated by calculating the holographic intensities of Ge dimers and a Ge cluster. Amplitudes of the holographic undulations of the mixed XFH were twice as large as those of the conventional XFH. Furthermore, the image reconstructed from the theoretical mixed XFH data show atomic images as clear as those from the conventional XFH data.
|Number of pages||6|
|Journal||Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers|
|Issue number||9 A|
|Publication status||Published - 2000 Sep 1|
ASJC Scopus subject areas
- Physics and Astronomy(all)