New surface forces apparatus using two-beam interferometry

Hiroshi Kawai, Hiroshi Sakuma, Masashi Mizukami, Takashi Abe, Yasuhiro Fukao, Haruo Tajima, Kazue Kurihara

Research output: Contribution to journalArticlepeer-review

32 Citations (Scopus)

Abstract

We designed a new surface forces apparatus for measuring the interactions between two nontransparent substrates and/or in nontransparent liquids. The small displacement of a surface, the bottom one in this study, was measured by the two-beam (twin path) interferometry technique using the phase difference between the laser light reflected by the fixed mirror and that by the mirror on the back of the bottom surface unit. It is possible to determine the distance with a resolution of 1 nm in the working range of 5 μm. This apparatus was successfully applied to measure the forces between mica surfaces in pure water and aqueous KBr solutions.

Original languageEnglish
Article number043701
JournalReview of Scientific Instruments
Volume79
Issue number4
DOIs
Publication statusPublished - 2008 May 8

ASJC Scopus subject areas

  • Instrumentation

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