A new photothermal technique is proposed. It is based on the temperature characteristic of the dielectric constant of light-irradiated material. A quantitative derivation is presented for the alternating capacitance variation in terms of the optical, thermal, dielectric and geometric parameters of the system. The experimental results for TiO2-Bi2TiO4O11 ceramics, lead zirconate titanate ceramics and ZnSe semiconductor are shown, where the observed signals agree with theoretical ones very well.
|Journal||Progress in Natural Science|
|Issue number||SPEC. ISS.|
|Publication status||Published - 1996 Dec 1|
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