New NBTI lifetime prediction method for ultra thin siO2 films

K. Watanabe, R. Kuroda, A. Teramoto, S. Sugawa, T. Ohmi

Research output: Contribution to journalConference articlepeer-review

3 Citations (Scopus)

Fingerprint Dive into the research topics of 'New NBTI lifetime prediction method for ultra thin siO<sub>2</sub> films'. Together they form a unique fingerprint.

Engineering & Materials Science