New microscope for measuring the distribution of nonlinear dielectric properties

Yasuo Cho, Akio Kirihara, Takahiro Saeki

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

This paper describes a new technique for imaging the distribution of nonlinear dielectric constants of ferroelectric materials. This technique is based on the principle that the nonlinear (third-order) dielectric constants (third-rank tensor) are very sensitive to the state of the spontaneous polarization and the quality of the crystallization of materials, while the linear (second-order) dielectric constants (second-rank tensor) are insensitive to them. Applying this principle, a new microscope for measuring the distribution of nonlinear dielectric properties is developed. This new microscope is used to observe the distribution of the polarization of ferroelectric materials such as lead zirconate titanate (PZT) ceramic and piezoelectric polymer.

Original languageEnglish
Pages (from-to)68-75
Number of pages8
JournalElectronics and Communications in Japan, Part II: Electronics (English translation of Denshi Tsushin Gakkai Ronbunshi)
Volume79
Issue number6
Publication statusPublished - 1996 Jun

Keywords

  • Ferroelectric materials
  • Microscope
  • Nonlinear dielectric constant
  • Piezoelectric materials

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Computer Networks and Communications
  • Electrical and Electronic Engineering

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