New evaluation of fullerene molecules on Si(111)-(7 × 7) reconstructed structure using non-contact scanning non-linear dielectric microscopy

Shin Ichiro Kobayashi, Yasuo Cho

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

Fullerene (C 60) molecules on an Si(111)-(7 × 7) surface have been investigated using non-contact scanning non-linear dielectric microscopy (NC-SNDM) under an ultra-high vacuum. The topography, the interface between the C 60 molecule and Si adatoms, and the internal structure of the C 60 molecules were successfully investigated. For ∼ 0 ML and ∼ 0.4 ML coverage, both phase reversal sites and sites without phase reversal could be observed in the first order phase (θ1) image. On the other hand, for 1 ML coverage, phase reversal could not be identified. These results indicate that charge transfer only occurred from Si adatoms to C 60 molecules at three-fold symmetric sites on the Si(111)-(7 × 7) surface, and the electric dipole moment is reflected in the electronic state of the C 60 molecules. The internal structure of C 60 molecules was clearly observed in topography by the second order amplitude (A 2) feedback signal for 1 ML coverage, reflecting the LDOS originating from the t 1u orbital.

Original languageEnglish
Pages (from-to)174-180
Number of pages7
JournalSurface Science
Volume606
Issue number3-4
DOIs
Publication statusPublished - 2012 Feb

Keywords

  • Fullerene
  • Non-contact scanning non-linear dielectric microscopy
  • Si(111)-(7 × 7) surface

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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