New area detector for atomic-resolution scanning transmission electron microscopy

Naoya Shibata, Yuji Kohno, Scott D. Findlay, Hidetaka Sawada, Yukihito Kondo, Yuichi Ikuhara

    Research output: Contribution to journalArticle

    63 Citations (Scopus)

    Abstract

    A new area detector for atomic-resolution scanning transmission electron microscopy (STEM) is developed and tested. The circular detector is divided into 16 segments which are individually optically coupled with photomultiplier tubes. Thus, 16 atomic-resolution STEM images which are sensitive to the spatial distribution of scattered electrons on the detector plane can be simultaneously obtained. This new detector can be potentially used not only for the simultaneous formation of common bright-field, low-angle annular dark-field and high-angle annular dark-field images, but also for the quantification of images by detecting the full range of scattered electrons and even for exploring novel atomic-resolution imaging modes by post-processing combination of the individual images.

    Original languageEnglish
    Pages (from-to)473-479
    Number of pages7
    JournalJournal of Electron Microscopy
    Volume59
    Issue number6
    DOIs
    Publication statusPublished - 2010 Dec 1

    Keywords

    • STEM
    • atomic-resolution imaging
    • detector

    ASJC Scopus subject areas

    • Instrumentation

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  • Cite this

    Shibata, N., Kohno, Y., Findlay, S. D., Sawada, H., Kondo, Y., & Ikuhara, Y. (2010). New area detector for atomic-resolution scanning transmission electron microscopy. Journal of Electron Microscopy, 59(6), 473-479. https://doi.org/10.1093/jmicro/dfq014