New analog readout architecture for low noise CMOS image sensors using column-parallel forward noise-canceling circuitry

Tsung Ling Li, Yasuyuki Goda, Shunichi Wakashima, Rihito Kuroda, Shigetoshi Sugawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents a new analog readout architecture for low-noise CMOS image sensors. A proposed forward noisecanceling circuitry has been developed in our readout architecture to provide a sharper noise-filtering. The new readout architecture consists of a column high-gain amplifier with correlated-double- sampling (CDS), a column forward noisecanceling circuitry, and column sample-and-hold circuits. Through the high-gain amplifier together with the forward noise-canceling circuitry, this readout architecture effectively reduces random noise of in-pixel source follower and column amplifier as well as temporal line noise from power supplies and pulse lines. A prototype 400(H) x 250(V) CMOS image sensor using the new readout architecture has been fabricated in a 0.18 μm 1-Poly 3-Metal CMOS technology with pinned-photodiode. Both the pixel pitch and the column circuit pitch are 4.5 μm. The input-referred noise of the new readout architecture is 37 μV rms, which has been reduced by 23 % compared to that of the conventional readout architecture. The input-referred noise of the pixel with new readout architecture is 72 μV rms, which has been reduced by 24 % compared to that of the pixel with conventional readout architecture.

Original languageEnglish
Title of host publicationProceedings of SPIE-IS and T Electronic Imaging - Sensors, Cameras, and Systems for Industrial and Scientific Applications XIV
DOIs
Publication statusPublished - 2013 Apr 10
EventSensors, Cameras, and Systems for Industrial and Scientific Applications XIV - Burlingame, CA, United States
Duration: 2013 Feb 62013 Feb 7

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8659
ISSN (Print)0277-786X

Other

OtherSensors, Cameras, and Systems for Industrial and Scientific Applications XIV
CountryUnited States
CityBurlingame, CA
Period13/2/613/2/7

Keywords

  • CMOS image sensor
  • analog readout architecture
  • noise canceling
  • readout circuit

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Li, T. L., Goda, Y., Wakashima, S., Kuroda, R., & Sugawa, S. (2013). New analog readout architecture for low noise CMOS image sensors using column-parallel forward noise-canceling circuitry. In Proceedings of SPIE-IS and T Electronic Imaging - Sensors, Cameras, and Systems for Industrial and Scientific Applications XIV [86590E] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8659). https://doi.org/10.1117/12.2003741