New ADXD/EDXD spectrometer for determining the structure of melts at high temperature

Kazumasa Sugiyama, Takeshi Shinkai, Yoshio Waseda

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

A new spectrometer for angular dispersive X-ray diffraction (ADXD) and energy dispersive X-ray diffraction (EDXD) facility has been built using a vertical type θ-θgoniometer, which makes possible to measure the diffraction profiles of high temperature melts over 200 mn-1. The fundamentals of this facility were tested by obtaining the interference function of molten NaAlSi3O8 at 1460 K. The feasibility of the EDXD analysis for high temperature melts was also confirmed by obtaining the well resolved RDF of molten LiNbO3 at 1550 K.

Original languageEnglish
Pages (from-to)231-237
Number of pages7
JournalScience Reports of the Rerearch Institutes Tohoku University Series A-Physics
Volume42
Issue number1
Publication statusPublished - 1996 Mar 1

Keywords

  • ADXD
  • EDXD
  • High temperature
  • Melt structure
  • RDF
  • X-ray diffraction

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Metals and Alloys

Fingerprint Dive into the research topics of 'New ADXD/EDXD spectrometer for determining the structure of melts at high temperature'. Together they form a unique fingerprint.

Cite this