Abstract
An electrostatic neutralization of multilayer-loading silicon wafers is demonstrated using a corona discharge ionizer in nitrogen atmosphere, where ac and dc voltages are applied to two needle electrodes for generation of the negative- and positive-charged particles, respectively. We observe a surface potential of the silicon wafer decreases from ±lkV to ±20V within three seconds. Moreover, the density profiles of the charged particles generated by the electrodes are experimentally and theoretically investigated in nitrogen and air atmospheres. Our results show the possibility that the negative-charged particles contributing to the electrostatic neutralization are electrons and negative ions in nitrogen and air atmospheres, respectively.
Original language | English |
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Pages (from-to) | 146-152+5 |
Journal | IEEJ Transactions on Fundamentals and Materials |
Volume | 129 |
Issue number | 3 |
DOIs | |
Publication status | Published - 2009 |
Externally published | Yes |
Keywords
- Charged-particle distribution
- Corona discharge
- Electrostatic neutralization
- Ionizer
ASJC Scopus subject areas
- Electrical and Electronic Engineering