Near-field microwave imaging of inhomogeneous KxFeySe2: Separation of topographic and electric features

Hideyuki Takahashi, Yoshinori Imai, Atsutaka Maeda

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

It is important for modern scanning microwave microscopes (SMMs) to overcome the effect of the surface roughness. Here, we report microwave conductivity imaging of the phase-separated iron chalcogenide KxFeySe2 (x=0.8, y=1.6-2), in which electric conductivity-induced contrast is distinguished from topography-induced contrast using a combination of a scanning tunneling microscope and a SMM. We observed the characteristic modulation of the local electric property that originates from the mesoscopic phase separation of the metallic and semiconducting phases in two different scanning modes: constant current mode and constant Q (CQ) mode. In particular, CQ scanning is useful because we obtain a qualitative image in which the topographic contrast is largely eliminated without degradation of the spatial resolution.

Original languageEnglish
Article number233106
JournalApplied Physics Letters
Volume106
Issue number23
DOIs
Publication statusPublished - 2015 Jun 8
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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