It is important for modern scanning microwave microscopes (SMMs) to overcome the effect of the surface roughness. Here, we report microwave conductivity imaging of the phase-separated iron chalcogenide KxFeySe2 (x=0.8, y=1.6-2), in which electric conductivity-induced contrast is distinguished from topography-induced contrast using a combination of a scanning tunneling microscope and a SMM. We observed the characteristic modulation of the local electric property that originates from the mesoscopic phase separation of the metallic and semiconducting phases in two different scanning modes: constant current mode and constant Q (CQ) mode. In particular, CQ scanning is useful because we obtain a qualitative image in which the topographic contrast is largely eliminated without degradation of the spatial resolution.
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)