NDE of a 3-D surface crack using closely coupled probes for DCPD technique

M. Saka; D. Hirota; H. Abé; I. Komura

doi:10.1115/1.2842346

NDE of a 3-D surface crack using closely coupled probes for DCPD technique

M. Saka, D. Hirota, H. Abé, I. Komura

ENG - Finemechanics

Research output: Contribution to journal › Article › peer-review

19 Citations (Scopus)

Abstract

A procedure of applying the d-c potential drop technique using the closely coupled probes to NDE of a 3-D surface crack is newly developed. The calibration equation for three sensors which differ in the distance between the probes is derived. Experiments validated the use of the calibration equation for the NDE of cracks. The method to use the three sensors properly based on the measuring sensitivity is shown.

Original language	English
Pages (from-to)	374-378
Number of pages	5
Journal	Journal of Pressure Vessel Technology, Transactions of the ASME
Volume	120
Issue number	4
DOIs	https://doi.org/10.1115/1.2842346
Publication status	Published - 1998 Nov 1

ASJC Scopus subject areas

Safety, Risk, Reliability and Quality
Mechanics of Materials
Mechanical Engineering

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10.1115/1.2842346

Cite this

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N2 - A procedure of applying the d-c potential drop technique using the closely coupled probes to NDE of a 3-D surface crack is newly developed. The calibration equation for three sensors which differ in the distance between the probes is derived. Experiments validated the use of the calibration equation for the NDE of cracks. The method to use the three sensors properly based on the measuring sensitivity is shown.

AB - A procedure of applying the d-c potential drop technique using the closely coupled probes to NDE of a 3-D surface crack is newly developed. The calibration equation for three sensors which differ in the distance between the probes is derived. Experiments validated the use of the calibration equation for the NDE of cracks. The method to use the three sensors properly based on the measuring sensitivity is shown.

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NDE of a 3-D surface crack using closely coupled probes for DCPD technique

Abstract

ASJC Scopus subject areas

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