Nature of carrier doping in T¤-La1.8−xEu0.2SrxCuO4 studied by X-ray photoemission and absorption spectroscopy

Chun Lin, Masafumi Horio, Takayuki Kawamata, Shin Saito, Keisuke Koshiishi, Shoya Sakamoto, Yujun Zhang, Kohei Yamamoto, Keisuke Ikeda, Yasuyuki Hirata, Kou Takubo, Hiroki Wadati, Akira Yasui, Yasumasa Takagi, Eiji Ikenaga, Tadashi Adachi, Yoji Koike, Atsushi Fujimori

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Abstract

Recently, hole-doped superconducting cuprates with the TA-structure La1.8xEu0.2SrxCuO4 (LESCO) have attracted a lot of attention. We have performed x-ray photoemission and absorption spectroscopy measurements on as-grown and reduced TA-LESCO. Results show that electrons and holes were doped by reduction annealing and Sr substitution, respectively. However, it is shown that the system remains on the electron-doped side of the Mott insulator or that the charge-transfer gap is collapsed in the parent compound.

Original languageEnglish
Article number11500
Journaljournal of the physical society of japan
Volume88
Issue number11
DOIs
Publication statusPublished - 2019 Jan 1

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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    Lin, C., Horio, M., Kawamata, T., Saito, S., Koshiishi, K., Sakamoto, S., Zhang, Y., Yamamoto, K., Ikeda, K., Hirata, Y., Takubo, K., Wadati, H., Yasui, A., Takagi, Y., Ikenaga, E., Adachi, T., Koike, Y., & Fujimori, A. (2019). Nature of carrier doping in T¤-La1.8−xEu0.2SrxCuO4 studied by X-ray photoemission and absorption spectroscopy. journal of the physical society of japan, 88(11), [11500]. https://doi.org/10.7566/JPSJ.88.115004