Native oxide layers formed on the surface of ultra high-purity iron and copper investigated by angle resolved XPS

S. Suzuki, Y. Ishikawa, M. Isshiki, Y. Waseda

Research output: Contribution to journalArticlepeer-review

80 Citations (Scopus)

Abstract

Angle resolved X-ray photoelectron spectroscopy (AR-XPS) has been used for characterizing native oxide layers formed on the surface of ultra high-purity iron and copper by exposure to air at room temperature. Thickness of an oxide layer formed on the surface of ultra high-purity iron is found to be thicker than that for ultra high-purity copper in the initial stage of oxidation and almost unchanged by air exposure time. On the other hand, thickness of an oxide layer formed on ultra high-purity copper is found to increase with increasing air exposure time. These results are consistent with spectral information for ultra high-purity iron and copper exposed to air; the chemical state of Fe in the surface of ultra high-purity iron is almost independent of exposure time, whereas the chemical state varies in the surface of ultra high-purity copper by exposure for a long term.

Original languageEnglish
Pages (from-to)1004-1009
Number of pages6
JournalMaterials Transactions, JIM
Volume38
Issue number11
DOIs
Publication statusPublished - 1997 Nov

Keywords

  • Angle resolved X-ray photoelectron spectroscopy
  • Initial oxidation
  • Ultra high-purity copper
  • Ultra high-purity iron

ASJC Scopus subject areas

  • Engineering(all)

Fingerprint Dive into the research topics of 'Native oxide layers formed on the surface of ultra high-purity iron and copper investigated by angle resolved XPS'. Together they form a unique fingerprint.

Cite this