Nanostructure and strain analysis of CeO2/YSZ strained superlattice

Takanori Kiguchi; Toyohiko J. Konno; Naoki Wakiya; Hitoshi Morioka; Keisuke Saito; Kazuo Shinozaki

doi:10.1016/j.mseb.2010.02.013

Nanostructure and strain analysis of CeO₂/YSZ strained superlattice

Takanori Kiguchi, Toyohiko J. Konno, Naoki Wakiya, Hitoshi Morioka, Keisuke Saito, Kazuo Shinozaki

Materials Processing and Characterization Division

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

In this study, the nanostructure and the strain fields in the superlattice [CeO₂/YSZ]₅ fabricated on the SiO₂/Si(0 0 1) substrate were investigated macroscopically and nanoscopically using X-ray diffraction (XRD) and high-resolution transmission electron microscopy (HRTEM) with geometric phase analysis (GPA) and related methods. The XRD analyses elucidated that the out-of-plane lattice parameter of CeO₂ and YSZ layers is relaxed. However, the in-plane lattice parameter is almost identical. Results of HRTEM and related analyses revealed that CeO₂ and YSZ layers form a superlattice structure. Results show that the superlattice has some defect structure, such as misorientation, varied thickness of CeO ₂ and YSZ layers, varied artificial periodicity, and interface roughness. However, the out-of-plane lattice parameter has periodicity corresponding to the superlattice structure. The in-plane lattice parameter is also equal to the local deviation. Therefore, the strain effect in the superlattice persists to some degree.

Original language	English
Pages (from-to)	220-228
Number of pages	9
Journal	Materials Science and Engineering B: Solid-State Materials for Advanced Technology
Volume	173
Issue number	1-3
DOIs	https://doi.org/10.1016/j.mseb.2010.02.013
Publication status	Published - 2010

Keywords

Ceria
Geometric phase analysis
Strain
Superlattice
Transmission electron microscopy
YSZ

ASJC Scopus subject areas

Materials Science(all)
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

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@article{06b703f362004ebd8a8a2512ba036077,

title = "Nanostructure and strain analysis of CeO2/YSZ strained superlattice",

abstract = "In this study, the nanostructure and the strain fields in the superlattice [CeO2/YSZ]5 fabricated on the SiO2/Si(0 0 1) substrate were investigated macroscopically and nanoscopically using X-ray diffraction (XRD) and high-resolution transmission electron microscopy (HRTEM) with geometric phase analysis (GPA) and related methods. The XRD analyses elucidated that the out-of-plane lattice parameter of CeO2 and YSZ layers is relaxed. However, the in-plane lattice parameter is almost identical. Results of HRTEM and related analyses revealed that CeO2 and YSZ layers form a superlattice structure. Results show that the superlattice has some defect structure, such as misorientation, varied thickness of CeO 2 and YSZ layers, varied artificial periodicity, and interface roughness. However, the out-of-plane lattice parameter has periodicity corresponding to the superlattice structure. The in-plane lattice parameter is also equal to the local deviation. Therefore, the strain effect in the superlattice persists to some degree.",

keywords = "Ceria, Geometric phase analysis, Strain, Superlattice, Transmission electron microscopy, YSZ",

author = "Takanori Kiguchi and Konno, {Toyohiko J.} and Naoki Wakiya and Hitoshi Morioka and Keisuke Saito and Kazuo Shinozaki",

year = "2010",

doi = "10.1016/j.mseb.2010.02.013",

language = "English",

volume = "173",

pages = "220--228",

journal = "Materials Science and Engineering B: Solid-State Materials for Advanced Technology",

issn = "0921-5107",

publisher = "Elsevier BV",

number = "1-3",

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TY - JOUR

T1 - Nanostructure and strain analysis of CeO2/YSZ strained superlattice

AU - Kiguchi, Takanori

AU - Konno, Toyohiko J.

AU - Wakiya, Naoki

AU - Morioka, Hitoshi

AU - Saito, Keisuke

AU - Shinozaki, Kazuo

PY - 2010

Y1 - 2010

N2 - In this study, the nanostructure and the strain fields in the superlattice [CeO2/YSZ]5 fabricated on the SiO2/Si(0 0 1) substrate were investigated macroscopically and nanoscopically using X-ray diffraction (XRD) and high-resolution transmission electron microscopy (HRTEM) with geometric phase analysis (GPA) and related methods. The XRD analyses elucidated that the out-of-plane lattice parameter of CeO2 and YSZ layers is relaxed. However, the in-plane lattice parameter is almost identical. Results of HRTEM and related analyses revealed that CeO2 and YSZ layers form a superlattice structure. Results show that the superlattice has some defect structure, such as misorientation, varied thickness of CeO 2 and YSZ layers, varied artificial periodicity, and interface roughness. However, the out-of-plane lattice parameter has periodicity corresponding to the superlattice structure. The in-plane lattice parameter is also equal to the local deviation. Therefore, the strain effect in the superlattice persists to some degree.

AB - In this study, the nanostructure and the strain fields in the superlattice [CeO2/YSZ]5 fabricated on the SiO2/Si(0 0 1) substrate were investigated macroscopically and nanoscopically using X-ray diffraction (XRD) and high-resolution transmission electron microscopy (HRTEM) with geometric phase analysis (GPA) and related methods. The XRD analyses elucidated that the out-of-plane lattice parameter of CeO2 and YSZ layers is relaxed. However, the in-plane lattice parameter is almost identical. Results of HRTEM and related analyses revealed that CeO2 and YSZ layers form a superlattice structure. Results show that the superlattice has some defect structure, such as misorientation, varied thickness of CeO 2 and YSZ layers, varied artificial periodicity, and interface roughness. However, the out-of-plane lattice parameter has periodicity corresponding to the superlattice structure. The in-plane lattice parameter is also equal to the local deviation. Therefore, the strain effect in the superlattice persists to some degree.

KW - Ceria

KW - Geometric phase analysis

KW - Strain

KW - Superlattice

KW - Transmission electron microscopy

KW - YSZ

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