Abstract
In this study, the nanostructure and the strain fields in the superlattice [CeO2/YSZ]5 fabricated on the SiO2/Si(0 0 1) substrate were investigated macroscopically and nanoscopically using X-ray diffraction (XRD) and high-resolution transmission electron microscopy (HRTEM) with geometric phase analysis (GPA) and related methods. The XRD analyses elucidated that the out-of-plane lattice parameter of CeO2 and YSZ layers is relaxed. However, the in-plane lattice parameter is almost identical. Results of HRTEM and related analyses revealed that CeO2 and YSZ layers form a superlattice structure. Results show that the superlattice has some defect structure, such as misorientation, varied thickness of CeO 2 and YSZ layers, varied artificial periodicity, and interface roughness. However, the out-of-plane lattice parameter has periodicity corresponding to the superlattice structure. The in-plane lattice parameter is also equal to the local deviation. Therefore, the strain effect in the superlattice persists to some degree.
Original language | English |
---|---|
Pages (from-to) | 220-228 |
Number of pages | 9 |
Journal | Materials Science and Engineering B: Solid-State Materials for Advanced Technology |
Volume | 173 |
Issue number | 1-3 |
DOIs | |
Publication status | Published - 2010 |
Keywords
- Ceria
- Geometric phase analysis
- Strain
- Superlattice
- Transmission electron microscopy
- YSZ
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering