TY - JOUR
T1 - Nanostructural characterization of YBCO films on metal tape with textured buffer layer fabricated by pulsed-laser deposition
AU - Kato, T.
AU - Sasaki, H.
AU - Sasaki, Y.
AU - Hirayama, T.
AU - Ikuhara, Y.
AU - Watanabe, T.
AU - Ibi, A.
AU - Iwai, H.
AU - Muroga, T.
AU - Miyata, S.
AU - Yamada, Y.
AU - Iijima, Y.
AU - Kakimoto, K.
AU - Sutoh, Y.
AU - Saitoh, T.
AU - Izumi, T.
AU - Shiohara, Y.
N1 - Funding Information:
This work was supported by the New Energy and Industrial Technology Development Organization (NEDO) as the Collaborative Research and Development of Fundamental Technologies for Superconductivity Applications.
Copyright:
Copyright 2008 Elsevier B.V., All rights reserved.
PY - 2006/5
Y1 - 2006/5
N2 - Thick YBa2Cu3O7-x (YBCO) films with high critical current density (Jc) values were deposited by pulsed-laser deposition (PLD) on Hastelloy with a textured CeO2/Gd 2Zr2O7 buffer layer. Both cross-sectional and plan-view TEM specimens of the YBCO films were prepared, and then the nanostructural characterization of the films was performed by transmission electron microscopy (TEM). The YBCO films less than 1 μm thick were predominantly composed of c-axis-oriented grains, however, many a-axis-oriented grains, which grew larger with the increase of the thickness of the YBCO film, were formed beyond about 1 μm from the CeO2 interface. We found Y2O3 and copper oxides between a- and c-axes-oriented grains. In particular, Y2O3 grains were formed between the {001} plane of an a-axis-oriented grain and the {100} or {010} plane of a c-axis-oriented grain. The orientation relationships between Y2O 3 and YBCO are found to be; (001)YBCO//(001)Y2O 3 and (100)YBCO//(110)Y2O3. In addition, we also found gaps between YBCO grains. Since a-axis-oriented grain growth and the formation of Y2O3, copper oxides and the gaps are considered to reduce the J c values of the YBCO film, it is important to determine the optimum process conditions to suppress the nucleation of a-axis-oriented grains, impurity oxides and gaps.
AB - Thick YBa2Cu3O7-x (YBCO) films with high critical current density (Jc) values were deposited by pulsed-laser deposition (PLD) on Hastelloy with a textured CeO2/Gd 2Zr2O7 buffer layer. Both cross-sectional and plan-view TEM specimens of the YBCO films were prepared, and then the nanostructural characterization of the films was performed by transmission electron microscopy (TEM). The YBCO films less than 1 μm thick were predominantly composed of c-axis-oriented grains, however, many a-axis-oriented grains, which grew larger with the increase of the thickness of the YBCO film, were formed beyond about 1 μm from the CeO2 interface. We found Y2O3 and copper oxides between a- and c-axes-oriented grains. In particular, Y2O3 grains were formed between the {001} plane of an a-axis-oriented grain and the {100} or {010} plane of a c-axis-oriented grain. The orientation relationships between Y2O 3 and YBCO are found to be; (001)YBCO//(001)Y2O 3 and (100)YBCO//(110)Y2O3. In addition, we also found gaps between YBCO grains. Since a-axis-oriented grain growth and the formation of Y2O3, copper oxides and the gaps are considered to reduce the J c values of the YBCO film, it is important to determine the optimum process conditions to suppress the nucleation of a-axis-oriented grains, impurity oxides and gaps.
UR - http://www.scopus.com/inward/record.url?scp=33744741094&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=33744741094&partnerID=8YFLogxK
U2 - 10.1007/s10853-006-7785-z
DO - 10.1007/s10853-006-7785-z
M3 - Article
AN - SCOPUS:33744741094
VL - 41
SP - 2587
EP - 2595
JO - Journal of Materials Science
JF - Journal of Materials Science
SN - 0022-2461
IS - 9
ER -