Nanostructural characterization of YBCO films on metal tape with textured buffer layer fabricated by pulsed-laser deposition

T. Kato, H. Sasaki, Y. Sasaki, T. Hirayama, Y. Ikuhara, T. Watanabe, A. Ibi, H. Iwai, T. Muroga, S. Miyata, Y. Yamada, Y. Iijima, K. Kakimoto, Y. Sutoh, T. Saitoh, T. Izumi, Y. Shiohara

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    5 Citations (Scopus)

    Abstract

    Thick YBa2Cu3O7-x (YBCO) films with high critical current density (Jc) values were deposited by pulsed-laser deposition (PLD) on Hastelloy with a textured CeO2/Gd 2Zr2O7 buffer layer. Both cross-sectional and plan-view TEM specimens of the YBCO films were prepared, and then the nanostructural characterization of the films was performed by transmission electron microscopy (TEM). The YBCO films less than 1 μm thick were predominantly composed of c-axis-oriented grains, however, many a-axis-oriented grains, which grew larger with the increase of the thickness of the YBCO film, were formed beyond about 1 μm from the CeO2 interface. We found Y2O3 and copper oxides between a- and c-axes-oriented grains. In particular, Y2O3 grains were formed between the {001} plane of an a-axis-oriented grain and the {100} or {010} plane of a c-axis-oriented grain. The orientation relationships between Y2O 3 and YBCO are found to be; (001)YBCO//(001)Y2O 3 and (100)YBCO//(110)Y2O3. In addition, we also found gaps between YBCO grains. Since a-axis-oriented grain growth and the formation of Y2O3, copper oxides and the gaps are considered to reduce the J c values of the YBCO film, it is important to determine the optimum process conditions to suppress the nucleation of a-axis-oriented grains, impurity oxides and gaps.

    Original languageEnglish
    Pages (from-to)2587-2595
    Number of pages9
    JournalJournal of Materials Science
    Volume41
    Issue number9
    DOIs
    Publication statusPublished - 2006 May

    ASJC Scopus subject areas

    • Materials Science(all)
    • Mechanics of Materials
    • Mechanical Engineering

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