Nanoscale Visualization of Phase Transition in Melting of Sn-Bi Particles by in situ Hard X-ray Ptychographic Coherent Diffraction Imaging

Nozomu Ishiguro, Takaya Higashino, Makoto Hirose, Yukio Takahashi

Research output: Contribution to journalArticlepeer-review

Abstract

The phase transition in the melting of Sn-Bi eutectic solder alloy particles was observed by in situ hard X-ray ptychographic coherent diffraction imaging with a pin-point heating system. Ptychographic diffraction patterns of micrometer-sized Sn-Bi particles were collected at temperatures from room temperature to 540 K. The projection images of each particle were reconstructed at a spatial resolution of 25 nm, showing differences in the phase shifts due to two crystal phases in the Sn-Bi alloy system and the Sn/Bi oxides at the surface. By quantitatively evaluating the Bi content, it became clear that the nonuniformity of the composition of Sn and Bi at the single-particle level exists when the particles are synthesized by centrifugal atomization.

Original languageEnglish
Pages (from-to)878-885
Number of pages8
JournalMicroscopy and Microanalysis
Volume26
Issue number5
DOIs
Publication statusPublished - 2020 Oct 1

Keywords

  • Eutectic solder
  • In situ observation
  • Ptychographic coherent diffraction imaging
  • Sn-Bi alloy

ASJC Scopus subject areas

  • Instrumentation

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