Abstract
The phase transition in the melting of Sn-Bi eutectic solder alloy particles was observed by in situ hard X-ray ptychographic coherent diffraction imaging with a pin-point heating system. Ptychographic diffraction patterns of micrometer-sized Sn-Bi particles were collected at temperatures from room temperature to 540 K. The projection images of each particle were reconstructed at a spatial resolution of 25 nm, showing differences in the phase shifts due to two crystal phases in the Sn-Bi alloy system and the Sn/Bi oxides at the surface. By quantitatively evaluating the Bi content, it became clear that the nonuniformity of the composition of Sn and Bi at the single-particle level exists when the particles are synthesized by centrifugal atomization.
Original language | English |
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Pages (from-to) | 878-885 |
Number of pages | 8 |
Journal | Microscopy and Microanalysis |
Volume | 26 |
Issue number | 5 |
DOIs | |
Publication status | Published - 2020 Oct 1 |
Externally published | Yes |
Keywords
- Eutectic solder
- In situ observation
- Ptychographic coherent diffraction imaging
- Sn-Bi alloy
ASJC Scopus subject areas
- Instrumentation