Abstract
Microstructures of CuI-Cu2MoO4 superionic conducting glasses have been studied by analytical transmission electron microscopy equipped with high angle annular detector dark field (HAADF) detector and energy dispersive X-ray spectroscopy (EDS). Structural inhomogeneities of 5-10 nm in size are observed from HAADF images in the glass. Deference of composition between bright and dark contrast regions is clearly confirmed by EDS experiments. The nanoscale phase separation of 5-10 nm in size has been clarified by HAADF and EDS experiments.
Original language | English |
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Pages (from-to) | 132-135 |
Number of pages | 4 |
Journal | Journal of Non-Crystalline Solids |
Volume | 357 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2011 Jan 1 |
Keywords
- Microstructure
- Oxide glass
- Superionic conductor
- Transmission electron microscopy
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Ceramics and Composites
- Condensed Matter Physics
- Materials Chemistry