TY - JOUR
T1 - Nanoscale diffusion tracing by radioactive 8Li tracer
AU - Ishiyama, Hironobu
AU - Jeong, Sun Chan
AU - Watanabe, Yutaka
AU - Hirayama, Yoshikazu
AU - Imai, Nobuaki
AU - Miyatake, Hiroari
AU - Oyaizu, Michiharu
AU - Katayama, Ichiro
AU - Osa, Akihiko
AU - Otokawa, Yoshinori
AU - Matsuda, Makoto
AU - Nishio, Katsuhisa
AU - Makii, Hiroyuki
AU - Sato, Tetsuya
AU - Kuwata, Naoaki
AU - Kawamura, Junichi
AU - Nakao, Aiko
AU - Ueno, Hedeki
AU - Kim, Yung Hee
AU - Kimura, Sota
AU - Mukai, Momo
N1 - Publisher Copyright:
© 2014 The Japan Society of Applied Physics.
PY - 2014/11/1
Y1 - 2014/11/1
N2 - We have developed a nanoscale diffusion measurement method using an α-emitting radioactive 8Li tracer. In this method, while implanting a pulsed 8 keV 8Li beam, the α particles emitted at a small angle (10°) relative to the sample surface were detected as a function of time. The method has been successfully applied to measuring lithium diffusion coefficients for an amorphous Li4SiO4-Li3VO4 (LVSO) thin film with a thickness of several hundred nanometers, demonstrating that the present method is sensitive to diffusion coefficients down on the order of 10-12 cm2/s, which is more sensitive by about two orders of magnitude than that previously achieved.
AB - We have developed a nanoscale diffusion measurement method using an α-emitting radioactive 8Li tracer. In this method, while implanting a pulsed 8 keV 8Li beam, the α particles emitted at a small angle (10°) relative to the sample surface were detected as a function of time. The method has been successfully applied to measuring lithium diffusion coefficients for an amorphous Li4SiO4-Li3VO4 (LVSO) thin film with a thickness of several hundred nanometers, demonstrating that the present method is sensitive to diffusion coefficients down on the order of 10-12 cm2/s, which is more sensitive by about two orders of magnitude than that previously achieved.
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U2 - 10.7567/JJAP.53.110303
DO - 10.7567/JJAP.53.110303
M3 - Article
AN - SCOPUS:84909942498
VL - 53
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - 11
M1 - 110303
ER -