Nanoscale diffusion tracing by radioactive 8Li tracer

Hironobu Ishiyama; Sun Chan Jeong; Yutaka Watanabe; Yoshikazu Hirayama; Nobuaki Imai; Hiroari Miyatake; Michiharu Oyaizu; Ichiro Katayama; Akihiko Osa; Yoshinori Otokawa; Makoto Matsuda; Katsuhisa Nishio; Hiroyuki Makii; Tetsuya Sato; Naoaki Kuwata; Junichi Kawamura; Aiko Nakao; Hedeki Ueno; Yung Hee Kim; Sota Kimura; Momo Mukai

doi:10.7567/JJAP.53.110303

Nanoscale diffusion tracing by radioactive ⁸Li tracer

Hironobu Ishiyama, Sun Chan Jeong, Yutaka Watanabe, Yoshikazu Hirayama, Nobuaki Imai, Hiroari Miyatake, Michiharu Oyaizu, Ichiro Katayama, Akihiko Osa, Yoshinori Otokawa, Makoto Matsuda, Katsuhisa Nishio, Hiroyuki Makii, Tetsuya Sato, Naoaki Kuwata, Junichi Kawamura, Aiko Nakao, Hedeki Ueno, Yung Hee Kim, Sota KimuraMomo Mukai

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

We have developed a nanoscale diffusion measurement method using an α-emitting radioactive ⁸Li tracer. In this method, while implanting a pulsed 8 keV ⁸Li beam, the α particles emitted at a small angle (10°) relative to the sample surface were detected as a function of time. The method has been successfully applied to measuring lithium diffusion coefficients for an amorphous Li₄SiO₄-Li₃VO₄ (LVSO) thin film with a thickness of several hundred nanometers, demonstrating that the present method is sensitive to diffusion coefficients down on the order of 10^-12 cm²/s, which is more sensitive by about two orders of magnitude than that previously achieved.

Original language	English
Article number	110303
Journal	Japanese journal of applied physics
Volume	53
Issue number	11
DOIs	https://doi.org/10.7567/JJAP.53.110303
Publication status	Published - 2014 Nov 1

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

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10.7567/JJAP.53.110303

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Ishiyama, H., Jeong, S. C., Watanabe, Y., Hirayama, Y., Imai, N., Miyatake, H., Oyaizu, M., Katayama, I., Osa, A., Otokawa, Y., Matsuda, M., Nishio, K., Makii, H., Sato, T., Kuwata, N., Kawamura, J., Nakao, A., Ueno, H., Kim, Y. H., ... Mukai, M. (2014). Nanoscale diffusion tracing by radioactive ⁸Li tracer. Japanese journal of applied physics, 53(11), [110303]. https://doi.org/10.7567/JJAP.53.110303

Nanoscale diffusion tracing by radioactive ⁸Li tracer. / Ishiyama, Hironobu; Jeong, Sun Chan; Watanabe, Yutaka; Hirayama, Yoshikazu; Imai, Nobuaki; Miyatake, Hiroari; Oyaizu, Michiharu; Katayama, Ichiro; Osa, Akihiko; Otokawa, Yoshinori; Matsuda, Makoto; Nishio, Katsuhisa; Makii, Hiroyuki; Sato, Tetsuya; Kuwata, Naoaki; Kawamura, Junichi; Nakao, Aiko; Ueno, Hedeki; Kim, Yung Hee; Kimura, Sota; Mukai, Momo.

In: Japanese journal of applied physics, Vol. 53, No. 11, 110303, 01.11.2014.

Research output: Contribution to journal › Article › peer-review

Ishiyama, H, Jeong, SC, Watanabe, Y, Hirayama, Y, Imai, N, Miyatake, H, Oyaizu, M, Katayama, I, Osa, A, Otokawa, Y, Matsuda, M, Nishio, K, Makii, H, Sato, T, Kuwata, N, Kawamura, J, Nakao, A, Ueno, H, Kim, YH, Kimura, S & Mukai, M 2014, 'Nanoscale diffusion tracing by radioactive ⁸Li tracer', Japanese journal of applied physics, vol. 53, no. 11, 110303. https://doi.org/10.7567/JJAP.53.110303

Ishiyama, Hironobu ; Jeong, Sun Chan ; Watanabe, Yutaka ; Hirayama, Yoshikazu ; Imai, Nobuaki ; Miyatake, Hiroari ; Oyaizu, Michiharu ; Katayama, Ichiro ; Osa, Akihiko ; Otokawa, Yoshinori ; Matsuda, Makoto ; Nishio, Katsuhisa ; Makii, Hiroyuki ; Sato, Tetsuya ; Kuwata, Naoaki ; Kawamura, Junichi ; Nakao, Aiko ; Ueno, Hedeki ; Kim, Yung Hee ; Kimura, Sota ; Mukai, Momo. / Nanoscale diffusion tracing by radioactive ⁸Li tracer. In: Japanese journal of applied physics. 2014 ; Vol. 53, No. 11.

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abstract = "We have developed a nanoscale diffusion measurement method using an α-emitting radioactive 8Li tracer. In this method, while implanting a pulsed 8 keV 8Li beam, the α particles emitted at a small angle (10°) relative to the sample surface were detected as a function of time. The method has been successfully applied to measuring lithium diffusion coefficients for an amorphous Li4SiO4-Li3VO4 (LVSO) thin film with a thickness of several hundred nanometers, demonstrating that the present method is sensitive to diffusion coefficients down on the order of 10-12 cm2/s, which is more sensitive by about two orders of magnitude than that previously achieved.",

author = "Hironobu Ishiyama and Jeong, {Sun Chan} and Yutaka Watanabe and Yoshikazu Hirayama and Nobuaki Imai and Hiroari Miyatake and Michiharu Oyaizu and Ichiro Katayama and Akihiko Osa and Yoshinori Otokawa and Makoto Matsuda and Katsuhisa Nishio and Hiroyuki Makii and Tetsuya Sato and Naoaki Kuwata and Junichi Kawamura and Aiko Nakao and Hedeki Ueno and Kim, {Yung Hee} and Sota Kimura and Momo Mukai",

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AU - Jeong, Sun Chan

AU - Watanabe, Yutaka

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AU - Imai, Nobuaki

AU - Miyatake, Hiroari

AU - Oyaizu, Michiharu

AU - Katayama, Ichiro

AU - Osa, Akihiko

AU - Otokawa, Yoshinori

AU - Matsuda, Makoto

AU - Nishio, Katsuhisa

AU - Makii, Hiroyuki

AU - Sato, Tetsuya

AU - Kuwata, Naoaki

AU - Kawamura, Junichi

AU - Nakao, Aiko

AU - Ueno, Hedeki

AU - Kim, Yung Hee

AU - Kimura, Sota

AU - Mukai, Momo

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AB - We have developed a nanoscale diffusion measurement method using an α-emitting radioactive 8Li tracer. In this method, while implanting a pulsed 8 keV 8Li beam, the α particles emitted at a small angle (10°) relative to the sample surface were detected as a function of time. The method has been successfully applied to measuring lithium diffusion coefficients for an amorphous Li4SiO4-Li3VO4 (LVSO) thin film with a thickness of several hundred nanometers, demonstrating that the present method is sensitive to diffusion coefficients down on the order of 10-12 cm2/s, which is more sensitive by about two orders of magnitude than that previously achieved.

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Nanoscale diffusion tracing by radioactive ⁸Li tracer

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