Nanoscale diffusion tracing by radioactive 8Li tracer

Hironobu Ishiyama, Sun Chan Jeong, Yutaka Watanabe, Yoshikazu Hirayama, Nobuaki Imai, Hiroari Miyatake, Michiharu Oyaizu, Ichiro Katayama, Akihiko Osa, Yoshinori Otokawa, Makoto Matsuda, Katsuhisa Nishio, Hiroyuki Makii, Tetsuya Sato, Naoaki Kuwata, Junichi Kawamura, Aiko Nakao, Hedeki Ueno, Yung Hee Kim, Sota KimuraMomo Mukai

    Research output: Contribution to journalArticlepeer-review

    4 Citations (Scopus)

    Abstract

    We have developed a nanoscale diffusion measurement method using an α-emitting radioactive 8Li tracer. In this method, while implanting a pulsed 8 keV 8Li beam, the α particles emitted at a small angle (10°) relative to the sample surface were detected as a function of time. The method has been successfully applied to measuring lithium diffusion coefficients for an amorphous Li4SiO4-Li3VO4 (LVSO) thin film with a thickness of several hundred nanometers, demonstrating that the present method is sensitive to diffusion coefficients down on the order of 10-12 cm2/s, which is more sensitive by about two orders of magnitude than that previously achieved.

    Original languageEnglish
    Article number110303
    JournalJapanese journal of applied physics
    Volume53
    Issue number11
    DOIs
    Publication statusPublished - 2014 Nov 1

    ASJC Scopus subject areas

    • Engineering(all)
    • Physics and Astronomy(all)

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