Nanorheology on polymer surface with atomic force microscopy

Hideyuki Nukaga, Mie Kaneko, So Fujinami, Hiroyuki Watabe, Ken Nakajima, Toshio Nishi

    Research output: Contribution to conferencePaperpeer-review

    1 Citation (Scopus)

    Abstract

    Our interest exists on the understanding of viscoelastic properties of polymeric surfaces by means of nanorheology atomic force microscopy (AFM). In analyzing the force curve using Hertz theories, elastic modulus was obtained with nanometer-scale resolution. Furthermore, sample deformation by the force exerted was also estimated from the force curve analyses. When PS/PIB blend samples were observed in contact-mode operation, PIB rich phases appeared as depressions. However, this was artifact caused by very small elastic modulus of PIB. We reconstructed "real height image" from original height image and sample deformation image, which was almost flat at the apparent depression. We will report its detailed procedure together with the method of obtaining elastic modulus distribution image at the site.

    Original languageEnglish
    Number of pages1
    Publication statusPublished - 2005 Dec 1
    Event54th SPSJ Annual Meeting 2005 - Yokohama, Japan
    Duration: 2005 May 252005 May 27

    Other

    Other54th SPSJ Annual Meeting 2005
    CountryJapan
    CityYokohama
    Period05/5/2505/5/27

    Keywords

    • Atomic Force Microscopy
    • Force-curve
    • Hertz theory
    • Nanorheology
    • Polymer Blend

    ASJC Scopus subject areas

    • Engineering(all)

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