Abstract
Our purpose is to estimate the viscoelastic properties of polymeric surfaces in nanometer scale with atomic force microscopy (AFM). Particularly, we direct an attention to force-distance curve (force curve), whose profile gives qualitative information about the hardness of sample. But in this time, to investigate quantitative values of mechanical properties, we use the method analyzing force curves based on the JKR theory. Furthermore, we discuss the dependence of elastic modulus or adhesive energy of IIR on temperature, scan rate and indentation depth.
Original language | English |
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Number of pages | 1 |
Publication status | Published - 2006 Oct 19 |
Event | 55th SPSJ Annual Meeting - Nagoya, Japan Duration: 2006 May 24 → 2006 May 26 |
Other
Other | 55th SPSJ Annual Meeting |
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Country/Territory | Japan |
City | Nagoya |
Period | 06/5/24 → 06/5/26 |
Keywords
- Atomic Force Microscopy
- Force-curve
- JKR theory
- Nanorheology
ASJC Scopus subject areas
- Engineering(all)