Nanorheology of polymer blends investigated by atomic force microscopy

Ken Nakajima, Hideki Yamaguchi, Jeong Chang Lee, Masami Kageshima, Takayuki Ikehara, Toshio Nishi

    Research output: Contribution to journalArticlepeer-review

    51 Citations (Scopus)


    We measured force-distance curves of polystyrene (PS)/poly (vinyl methyl ether) (PVME) blend thin films using atomic force microscopy (AFM) in order to pursue the possible usage of AFM as a tool for detecting viscoelastic properties of polymeric materials from a nanoscopic point of view. In quasi-static measurements of force-distance curves for a sample whose PS content equals 100%, both adhesive force and capillary force were measured separately. A phenomenon possibly assigned to pulling off of polymer chains by an AFM tip could also be observed for a sample whose PS content equals 60%. By changing the velocity of the AFM tip acting on a blend sample whose PS content equals 40%, we confirmed that the law of time-temperature reducibility holds even on such a nanoscopic scale. This blend sample behaved as a viscous fluid at room temperature, while its behavior became glassy when faster movements of the AFM tip were applied. A discussion on the future development of a new field of research which should be called "nanorheology" was also presented.

    Original languageEnglish
    Pages (from-to)3850-3854
    Number of pages5
    JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
    Issue number6 SUPPL. B
    Publication statusPublished - 1997 Jun


    • Atomic force microscopy
    • Force-distance curve
    • Nanorheology
    • Polystyrene/poly (vinyl methyl ether) blend
    • Time-temperature reducibility
    • Viscoelasticity

    ASJC Scopus subject areas

    • Engineering(all)
    • Physics and Astronomy(all)

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