Nanorheology mapping by atomic force microscopy

Ken Nakajima; So Fujinami; Hideyuki Nukaga; Hiroyuki Watabe; Hiroki Kitano; Naoto Ono; Katsuyoshi Endoh; Mie Kaneko; Toshio Nishi

doi:10.1295/koron.62.476

Nanorheology mapping by atomic force microscopy

Ken Nakajima, So Fujinami, Hideyuki Nukaga, Hiroyuki Watabe, Hiroki Kitano, Naoto Ono, Katsuyoshi Endoh, Mie Kaneko, Toshio Nishi

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

Abstract

A novel idea to extend the capability of an atomic force microscopy (AFM) to soft materials is proposed for the purpose of obtaining sample deformation and modulus distribution images as well as topographic image (nanorheology mapping). An immiscible polymer blend system, elongated natural rubber, and hair cross section are used as model samples. Further extension of this idea leads to tapping-mode force-distance curve analysis aiming at the acquisition of sample deformation information. A force modulation technique is also reviewed in terms of the future development of three-dimensional mechanical properties imaging by AFM, together with the above two techniques.

Original language	English
Pages (from-to)	476-487
Number of pages	12
Journal	KOBUNSHI RONBUNSHU
Volume	62
Issue number	10
DOIs	https://doi.org/10.1295/koron.62.476
Publication status	Published - 2005 Oct

Keywords

Atomic force microscopy
Force modulation
Force-distance curve
Nanorheology mapping
Sample deformation
Tapping-mode

ASJC Scopus subject areas

Chemical Engineering (miscellaneous)
Materials Science (miscellaneous)
Environmental Science(all)
Polymers and Plastics

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AU - Nakajima, Ken

AU - Fujinami, So

AU - Nukaga, Hideyuki

AU - Watabe, Hiroyuki

AU - Kitano, Hiroki

AU - Ono, Naoto

AU - Endoh, Katsuyoshi

AU - Kaneko, Mie

AU - Nishi, Toshio

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KW - Force-distance curve

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KW - Sample deformation

KW - Tapping-mode

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Nanorheology mapping by atomic force microscopy

Abstract

Keywords

ASJC Scopus subject areas

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