Nanorheology mapping by atomic force microscopy

Ken Nakajima, So Fujinami, Hideyuki Nukaga, Hiroyuki Watabe, Hiroki Kitano, Naoto Ono, Katsuyoshi Endoh, Mie Kaneko, Toshio Nishi

    Research output: Contribution to journalArticlepeer-review

    10 Citations (Scopus)


    A novel idea to extend the capability of an atomic force microscopy (AFM) to soft materials is proposed for the purpose of obtaining sample deformation and modulus distribution images as well as topographic image (nanorheology mapping). An immiscible polymer blend system, elongated natural rubber, and hair cross section are used as model samples. Further extension of this idea leads to tapping-mode force-distance curve analysis aiming at the acquisition of sample deformation information. A force modulation technique is also reviewed in terms of the future development of three-dimensional mechanical properties imaging by AFM, together with the above two techniques.

    Original languageEnglish
    Pages (from-to)476-487
    Number of pages12
    Issue number10
    Publication statusPublished - 2005 Oct


    • Atomic force microscopy
    • Force modulation
    • Force-distance curve
    • Nanorheology mapping
    • Sample deformation
    • Tapping-mode

    ASJC Scopus subject areas

    • Chemical Engineering (miscellaneous)
    • Materials Science (miscellaneous)
    • Environmental Science(all)
    • Polymers and Plastics

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