Abstract
A novel idea to extend the capability of an atomic force microscopy (AFM) to soft materials is proposed for the purpose of obtaining sample deformation and modulus distribution images as well as topographic image (nanorheology mapping). An immiscible polymer blend system, elongated natural rubber, and hair cross section are used as model samples. Further extension of this idea leads to tapping-mode force-distance curve analysis aiming at the acquisition of sample deformation information. A force modulation technique is also reviewed in terms of the future development of three-dimensional mechanical properties imaging by AFM, together with the above two techniques.
Original language | English |
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Pages (from-to) | 476-487 |
Number of pages | 12 |
Journal | KOBUNSHI RONBUNSHU |
Volume | 62 |
Issue number | 10 |
DOIs | |
Publication status | Published - 2005 Oct |
Externally published | Yes |
Keywords
- Atomic force microscopy
- Force modulation
- Force-distance curve
- Nanorheology mapping
- Sample deformation
- Tapping-mode
ASJC Scopus subject areas
- Chemical Engineering (miscellaneous)
- Materials Science (miscellaneous)
- Environmental Science(all)
- Polymers and Plastics