Nanorheological mapping of rubbers by atomic force microscopy

Takaaki Igarashi, So Fujinami, Toshio Nishi, Naoki Asao, And Ken Nakajima

    Research output: Contribution to journalArticlepeer-review

    48 Citations (Scopus)


    A novel atomic force microscopy (AFM) method is used for nanometer-scale mapping of the frequency dependence of the storage modulus, loss modulus, and loss tangent (tan δ) in rubber specimens. Our method includes a modified AFM instrument, which has an additional piezoelectric actuator placed between the specimen and AFM scanner. The specimen and AFM cantilever are oscillated by this actuator with a frequency between 1 Hz and 20 kHz. On the basis of contact mechanics between the probe and the sample, the viscoelastic properties were determined from the amplitude and phase shift of the cantilever oscillation. The values of the storage and loss moduli using our method are similar to those using bulk dynamic mechanical analysis (DMA) measurements. Moreover, the peak frequency of tan δ corresponds to that of bulk DMA measurements.

    Original languageEnglish
    Pages (from-to)1916-1922
    Number of pages7
    Issue number5
    Publication statusPublished - 2013 Mar 12

    ASJC Scopus subject areas

    • Organic Chemistry
    • Polymers and Plastics
    • Inorganic Chemistry
    • Materials Chemistry


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