Nanorheological mapping of rubbers by atomic force microscopy

Takaaki Igarashi; So Fujinami; Toshio Nishi; Naoki Asao; And Ken Nakajima

doi:10.1021/ma302616a

Nanorheological mapping of rubbers by atomic force microscopy

Takaaki Igarashi, So Fujinami, Toshio Nishi, Naoki Asao, And Ken Nakajima

Research output: Contribution to journal › Article › peer-review

48 Citations (Scopus)

Abstract

A novel atomic force microscopy (AFM) method is used for nanometer-scale mapping of the frequency dependence of the storage modulus, loss modulus, and loss tangent (tan δ) in rubber specimens. Our method includes a modified AFM instrument, which has an additional piezoelectric actuator placed between the specimen and AFM scanner. The specimen and AFM cantilever are oscillated by this actuator with a frequency between 1 Hz and 20 kHz. On the basis of contact mechanics between the probe and the sample, the viscoelastic properties were determined from the amplitude and phase shift of the cantilever oscillation. The values of the storage and loss moduli using our method are similar to those using bulk dynamic mechanical analysis (DMA) measurements. Moreover, the peak frequency of tan δ corresponds to that of bulk DMA measurements.

Original language	English
Pages (from-to)	1916-1922
Number of pages	7
Journal	Macromolecules
Volume	46
Issue number	5
DOIs	https://doi.org/10.1021/ma302616a
Publication status	Published - 2013 Mar 12

ASJC Scopus subject areas

Organic Chemistry
Polymers and Plastics
Inorganic Chemistry
Materials Chemistry

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10.1021/ma302616a

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abstract = "A novel atomic force microscopy (AFM) method is used for nanometer-scale mapping of the frequency dependence of the storage modulus, loss modulus, and loss tangent (tan δ) in rubber specimens. Our method includes a modified AFM instrument, which has an additional piezoelectric actuator placed between the specimen and AFM scanner. The specimen and AFM cantilever are oscillated by this actuator with a frequency between 1 Hz and 20 kHz. On the basis of contact mechanics between the probe and the sample, the viscoelastic properties were determined from the amplitude and phase shift of the cantilever oscillation. The values of the storage and loss moduli using our method are similar to those using bulk dynamic mechanical analysis (DMA) measurements. Moreover, the peak frequency of tan δ corresponds to that of bulk DMA measurements.",

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AU - Igarashi, Takaaki

AU - Fujinami, So

AU - Nishi, Toshio

AU - Asao, Naoki

AU - Nakajima, And Ken

PY - 2013/3/12

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AB - A novel atomic force microscopy (AFM) method is used for nanometer-scale mapping of the frequency dependence of the storage modulus, loss modulus, and loss tangent (tan δ) in rubber specimens. Our method includes a modified AFM instrument, which has an additional piezoelectric actuator placed between the specimen and AFM scanner. The specimen and AFM cantilever are oscillated by this actuator with a frequency between 1 Hz and 20 kHz. On the basis of contact mechanics between the probe and the sample, the viscoelastic properties were determined from the amplitude and phase shift of the cantilever oscillation. The values of the storage and loss moduli using our method are similar to those using bulk dynamic mechanical analysis (DMA) measurements. Moreover, the peak frequency of tan δ corresponds to that of bulk DMA measurements.

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Nanorheological mapping of rubbers by atomic force microscopy

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