Nanorheological investigation of polymeric surfaces by atomic force microscopy

Sae Nagai, So Fujinami, Ken Nakajima, Toshio Nishi

    Research output: Contribution to journalArticlepeer-review

    16 Citations (Scopus)

    Abstract

    A developed nanomechanical analysis of atomic force microscopy (AFM) based on the JKR theory has been applied to butyl rubber; isoprene-co-isobutylene rubber (IIR, butyl rubber). The force-deformation (F-δ) plots converted from force-distance curves of IIR varied with several experimental conditions, i.e., temperature, scan velocity and maximum loading force. We analyzed the plots by the JKR analysis referring to the 'two-points method' proposed by Walker and co-workers. It was found that the apparent Young's modulus and adhesive energy obtained from the method revealed well-defined appearance when plotted against maximum sample deformation. In conclusion, the 'time-temperature-stress superposition principle', which is one of the major characteristics of viscoelastic materials, proved to be valid even at nanometer scale.

    Original languageEnglish
    Pages (from-to)13-25
    Number of pages13
    JournalComposite Interfaces
    Volume16
    Issue number1
    DOIs
    Publication statusPublished - 2009 Feb 1

    Keywords

    • Atomic force microscopy
    • JKR theory
    • Nanorheology
    • Rubbery mathrials
    • Viscoelasticity

    ASJC Scopus subject areas

    • Ceramics and Composites
    • Physics and Astronomy(all)
    • Surfaces, Coatings and Films

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