Nanometer scale domain measurement of ferroelectric thin films using scanning nonlinear dielectric microscopy

Hirojuki Odagawa, Kaori Matsuura, Yasuo Cho

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

A very high-resolution scanning nonlinear dielectric microscope with nanometer resolution was developed for the observation of ferroelectric polarization. We demonstrate that the resolution of the microscope is of a sub-nanometer order by measurement of domains in PZT and SBT thin films. The experimental result shows that nano-sized 180° c-c ferroelectric domain with the width of 1.5 nm for PZT thin film are observed. The result also shows that the resolution of the microscope is less than 0.5 nm for the PZT thin film.

Original languageEnglish
Pages (from-to)XLXIII-XLXIV
JournalMaterials Research Society Symposium - Proceedings
Volume655
Publication statusPublished - 2001 Dec 1

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Fingerprint Dive into the research topics of 'Nanometer scale domain measurement of ferroelectric thin films using scanning nonlinear dielectric microscopy'. Together they form a unique fingerprint.

  • Cite this