Nanometer-scale characterization of surface materials by STM light emission spectroscopy

Y. Uehara, K. Ito, S. Ushioda

Research output: Contribution to journalArticlepeer-review

15 Citations (Scopus)

Abstract

Three typical applications of the STM light emission spectroscopy in nanometer-scale characterization of surface materials are reviewed. When electrons (holes) are injected from the tip of a STM to a sample surface, visible light is emitted. Since the beam diameter of electrons from the STM tip is narrower than ∼ 1 nm and moreover the beam energy is very low, one can obtain the light emission spectra of individual nanometer-scale structures without modifying them. By correlating the spectra with the size and shape of the structure, materials information about nanometer-scale individual structures can be obtained.

Original languageEnglish
Pages (from-to)247-254
Number of pages8
JournalApplied Surface Science
Volume107
DOIs
Publication statusPublished - 1996 Nov

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Physics and Astronomy(all)
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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