Nanodomain manipulation for reduction of bit error rate in terabit/inch2-class ferroelectric data storage

Yoshiomi Hiranaga, Kenkou Tanaka, Yasuo Cho

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Actual information data storage was studied using a data storage system based on scanning nonlinear dielectric microscopy. The bit error rates of the data recorded on a LiTaO3 single-crystal medium were evaluated. The data were written at the density of 403 Gbit/in.2 using a conductive-diamond-coated cantilever as a read/write probe. The tendencies of the bit errors were affected by the arrangement of the surrounding data bits. A writing method using bipolar pulses was discussed in order to decrease the bit error rate. The data with the highest recording density, 0.98 Tbit/in. 2, were recorded by using a sharp cantilever. The bit error rate was decreased by a factor of four by adjusting the pulse amplitudes according to the bit arrangements.

Original languageEnglish
Pages (from-to)2220-2224
Number of pages5
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume45
Issue number3 B
DOIs
Publication statusPublished - 2006 Mar 27

Keywords

  • Bit error rate
  • Ferroelectric data storage
  • LiTaO
  • Scanning nonlinear dielectric microscopy

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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