TY - JOUR
T1 - Nano-palpation AFM and its quantitative mechanical property mapping
AU - Nakajima, Ken
AU - Ito, Makiko
AU - Wang, Dong
AU - Liu, Hao
AU - Nguyen, Hung Kim
AU - Liang, Xiaobin
AU - Kumagai, Akemi
AU - Fujinami, So
N1 - Publisher Copyright:
© The Author 2014. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved.
PY - 2014/6
Y1 - 2014/6
N2 - We review nano-palpation atomic force microscopy, which offers quantitative mechanical property mapping especially for soft materials. The method measures force–deformation curves on the surfaces of soft materials. The emphasis is placed on how both Hertzian and Derjaguin–Muller–Toporov contact mechanics fail to reproduce the experimental curves and, alternatively, how the Johnson–Kendall–Roberts model does. We also describe the force–volume technique for obtaining a two-dimensional map of mechanical properties, such as the elastic modulus and adhesive energy, based on the above-mentioned analysis. Finally, we conclude with several counterpart measurements, which describe the viscoelastic nature of soft materials, and give examples, including vulcanized isoprene rubber and the current status of ISO standardization
AB - We review nano-palpation atomic force microscopy, which offers quantitative mechanical property mapping especially for soft materials. The method measures force–deformation curves on the surfaces of soft materials. The emphasis is placed on how both Hertzian and Derjaguin–Muller–Toporov contact mechanics fail to reproduce the experimental curves and, alternatively, how the Johnson–Kendall–Roberts model does. We also describe the force–volume technique for obtaining a two-dimensional map of mechanical properties, such as the elastic modulus and adhesive energy, based on the above-mentioned analysis. Finally, we conclude with several counterpart measurements, which describe the viscoelastic nature of soft materials, and give examples, including vulcanized isoprene rubber and the current status of ISO standardization
KW - Atomic force microscopy
KW - Contact mechanics
KW - Quantitative mechanical property mapping
KW - Soft materials
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U2 - 10.1093/jmicro/dfu009
DO - 10.1093/jmicro/dfu009
M3 - Review article
AN - SCOPUS:84929579219
VL - 63
SP - 193
EP - 207
JO - Microscopy (Oxford, England)
JF - Microscopy (Oxford, England)
SN - 2050-5698
IS - 3
ER -