Nano-palpation AFM and its quantitative mechanical property mapping

Ken Nakajima, Makiko Ito, Dong Wang, Hao Liu, Hung Kim Nguyen, Xiaobin Liang, Akemi Kumagai, So Fujinami

    Research output: Contribution to journalReview article

    31 Citations (Scopus)

    Abstract

    We review nano-palpation atomic force microscopy, which offers quantitative mechanical property mapping especially for soft materials. The method measures force–deformation curves on the surfaces of soft materials. The emphasis is placed on how both Hertzian and Derjaguin–Muller–Toporov contact mechanics fail to reproduce the experimental curves and, alternatively, how the Johnson–Kendall–Roberts model does. We also describe the force–volume technique for obtaining a two-dimensional map of mechanical properties, such as the elastic modulus and adhesive energy, based on the above-mentioned analysis. Finally, we conclude with several counterpart measurements, which describe the viscoelastic nature of soft materials, and give examples, including vulcanized isoprene rubber and the current status of ISO standardization

    Original languageEnglish
    Pages (from-to)193-207
    Number of pages15
    JournalMicroscopy
    Volume63
    Issue number3
    DOIs
    Publication statusPublished - 2014 Jan 1

    Keywords

    • Atomic force microscopy
    • Contact mechanics
    • Quantitative mechanical property mapping
    • Soft materials

    ASJC Scopus subject areas

    • Structural Biology
    • Instrumentation
    • Radiology Nuclear Medicine and imaging

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  • Cite this

    Nakajima, K., Ito, M., Wang, D., Liu, H., Nguyen, H. K., Liang, X., Kumagai, A., & Fujinami, S. (2014). Nano-palpation AFM and its quantitative mechanical property mapping. Microscopy, 63(3), 193-207. https://doi.org/10.1093/jmicro/dfu009