Nano-mechanical properties mappings of elastomer materials

Ken Nakajima, Toshio Nishi

    Research output: Contribution to conferencePaperpeer-review

    Abstract

    Nano-mechanical properties mappings of elastomer materials were realized by atomic force microscope. The information about elastic modulus and sample deformation could be quantitatively estimated by analyzing force-distance curves. If the surface deformed, it was no more valid to regard obtained apparent height image as the real topography. Thus, the method to reconstruct a real height image was also presented. The method was applied to the elongated natural rubber, carbon black or carbon nanotube reinforced natural rubber to investigate their interfacial structures.

    Original languageEnglish
    Pages3343-3344
    Number of pages2
    Publication statusPublished - 2006 Dec 1
    Event55th Society of Polymer Science Japan Symposium on Macromolecules - Toyama, Japan
    Duration: 2006 Sep 202006 Sep 22

    Other

    Other55th Society of Polymer Science Japan Symposium on Macromolecules
    CountryJapan
    CityToyama
    Period06/9/2006/9/22

    Keywords

    • Atomic force microscope
    • Carbon black
    • Carbon nanotube
    • Interface
    • Nano-mechanical properties mapping
    • Natural rubber

    ASJC Scopus subject areas

    • Engineering(all)

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