Nano domain engineering using scanning nonlinear dielectric microscopy

Yasuo Cho, Kaori Matsuura, Satoshi Kazuta, Hiroyuki Odagawa, Kazuya Terabe, Kenji Kitamura

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)


Scanning Nonlinear Dielectric Microscopy (SNDM) is the first successful purely electrical method for observing ferroelectric domains. Now its resolution has become to the sub-nanometer order. In this paper fundamental study on applying SNDM system to the ferroelectric reading and writing system is performed. At first, to check the performance of the SNDM system as a ferroelectric recording system, we conduct a fundamental study on the writing of domain inversion dot in PZT thin film and succeed to have a very small domain dots with the size of 25nm. Next, we form small inverted domain dots in stoichiometric LiTaO3 single crystal for the purpose of a basic investigation of domain dynamics in a very small area. The relationship between the voltage for domain reversal and the inverted area and the relationship between the inverted domain area and the voltage application time are obtained.

Original languageEnglish
Title of host publicationProceedings of the 2001 1st IEEE Conference on Nanotechnology, IEEE-NANO 2001
PublisherIEEE Computer Society
Number of pages6
ISBN (Electronic)0780372158
Publication statusPublished - 2001 Jan 1
Event1st IEEE Conference on Nanotechnology, IEEE-NANO 2001 - Maui, United States
Duration: 2001 Oct 282001 Oct 30

Publication series

NameProceedings of the IEEE Conference on Nanotechnology
ISSN (Print)1944-9399
ISSN (Electronic)1944-9380


Other1st IEEE Conference on Nanotechnology, IEEE-NANO 2001
Country/TerritoryUnited States

ASJC Scopus subject areas

  • Bioengineering
  • Electrical and Electronic Engineering
  • Materials Chemistry
  • Condensed Matter Physics


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