Nano-crystalline formation during stress-induced amorphization at crack tips in TiNi

K. Tozawa, Y. Haishi, Y. Matsukawa, S. Watanabe, S. Ohnuki, H. Takahashi

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

Although the local stress intensification in the immediate vicinity of a crack is known to be the primary driving force for material fracture, the mechanism of crack propagation is not well understood. In the present study in-situ microscopic observations have been carried out on thin films of NiTi intermetallic compounds under tensile loading conditions in a high-voltage electron microscope, followed by high-resolution TEM (HREM) observation. In addition to HREM, observation of the specimen fractured outside HVEM at room temperature was also carried out. Local stress-induced amorphization at moving crack tips has been observed. The HREM observation with a 200 kV FE-TEM revealed nano-crystalline formation in the intermediate region between the amorphous region and the crystalline region.

Original languageEnglish
Pages (from-to)613-616
Number of pages4
JournalJournal of Electron Microscopy
Volume48
Issue number5
DOIs
Publication statusPublished - 1999 Jan 1

Keywords

  • Crack tip
  • High-resolution electron microscopy
  • High-voltage electron microscopy
  • Nano-crystalline
  • Stress-inducted amorphization

ASJC Scopus subject areas

  • Instrumentation

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