Multiple scattering study of X-ray photoelectron diffraction from Si(111)-√3 × √3-Ag surface

X. Chen, T. Abukawa, J. Tani, S. Kono

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

X-ray photoelectron diffraction (XPD) from Si(111)-√3 × √3-Ag surface has been studied by an efficient multiple scattering cluster (MSC) scheme with sufficiently large clusters. It is found that there is a strong multiple scattering effect on the surface, and thus a failure of kinematical theory for XPD is seen for this surface. With a reliability factor (R-factor) analysis, we have shown that this surface is formed in a honeycomb-chained-trimer (HCT) structure. The optimized HCT structure parameters obtained from the dynamical XPD study agree with those from other surface techniques.

Original languageEnglish
Pages (from-to)560-564
Number of pages5
JournalSurface Science
Volume357-358
DOIs
Publication statusPublished - 1996 Jun 20

Keywords

  • Electron-solid interactions, scattering, diffraction
  • Low index single crystal surfaces
  • Metal-semiconductor nonmagnetic heterostructures
  • Photoelectron diffraction
  • Silicon
  • Silver
  • Surface relaxation and reconstruction

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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