TY - JOUR
T1 - Multiple ionization of rare gas atoms by intense free electron laser radiation at 51 and 61 nm
AU - Rudenko, A.
AU - Kurka, M.
AU - Foucar, L.
AU - Kühnel, K. U.
AU - Ullrich, J.
AU - Fukuzawa, H.
AU - Liu, X. J.
AU - Prümper, G.
AU - Okunishi, M.
AU - Ueda, K.
AU - Iwayama, H.
AU - Nagaya, K.
AU - Murakami, H.
AU - Sugishima, A.
AU - Yao, M.
AU - Motomura, K.
AU - Saito, N.
AU - Feifel, R.
AU - Czasch, A.
AU - Dörner, R.
AU - Belkacem, A.
AU - Nagasono, M.
AU - Higashiya, A.
AU - Togashi, T.
AU - Yabashi, M.
AU - Ishikawa, T.
AU - Ohashi, H.
AU - Kimura, H.
N1 - Funding Information:
We are grateful to SCSS Test Accelerator Operation Group at RIKEN for continuous support, staff of the technical service section of IMRAM for their help in the construction of the apparatus, and LBL optics group for the fabrication of the focusing mirror. This study was supported by the X-ray Free Electron Laser Utilization Research Project of the Ministry of Education, Culture, Sports, Science and Technology of Japan (MEXT), by Japan Society of Promoting Science (JSPS), and by the MPG Advanced Study Group at CFEL.
Funding Information:
This study was supported by the X-ray Free Electron Laser Utilization Research Project of the Ministry of Education, Culture, Sports, Science and Technology of Japan (MEXT), by Japan Society of Promoting Science (JSPS), and by the MPG Advanced Study Group at CFEL.
Publisher Copyright:
© 2009 IOP Publishing Ltd.
PY - 2009/12/24
Y1 - 2009/12/24
N2 - We have studied multiple ionization of rare gas atoms (Ne, Ar, Kr, Xe) by intense 51 nm and 61 nm radiation delivered by the EUV-FEL at SPring-8 Compact SASE Source (SCSS) Test Accelerator. Charge states as high as Ar7+ and Kr8+ have been observed. We present intensity dependent yields of multiply charged ions providing benchmark data for theory, and discuss the role of direct, sequential and resonant ionization channels.
AB - We have studied multiple ionization of rare gas atoms (Ne, Ar, Kr, Xe) by intense 51 nm and 61 nm radiation delivered by the EUV-FEL at SPring-8 Compact SASE Source (SCSS) Test Accelerator. Charge states as high as Ar7+ and Kr8+ have been observed. We present intensity dependent yields of multiply charged ions providing benchmark data for theory, and discuss the role of direct, sequential and resonant ionization channels.
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U2 - 10.1088/1742-6596/194/3/032021
DO - 10.1088/1742-6596/194/3/032021
M3 - Conference article
AN - SCOPUS:85035015902
VL - 194
JO - Journal of Physics: Conference Series
JF - Journal of Physics: Conference Series
SN - 1742-6588
IS - 3
M1 - 032021
T2 - 26th International Conference on Photonic, Electronic and Atomic Collisions
Y2 - 22 July 2009 through 28 July 2009
ER -