Multiple ionization of atomic argon irradiated by EUV free-electron laser pulses at 62 nm: Evidence of sequential electron strip

Koji Motomura, Hironobu Fukuzawa, L. Foucar, X. J. Liu, G. Prümper, Kiyoshi Ueda, N. Saito, H. Iwayama, K. Nagaya, H. Murakami, M. Yao, A. Belkacem, M. Nagasono, A. Higashiya, M. Yabashi, T. Ishikawa, H. Ohashi, H. Kimura

Research output: Contribution to journalArticlepeer-review

34 Citations (Scopus)

Abstract

We have investigated multiple ionization of atomic argon by extreme-ultraviolet light pulses (62 nm, 100 fs in width, <2 × 10 14 W cm-2) at the free-electron laser facility in Japan, and observed highly charged ions with the charge state up to +6. The measured laser power dependence of the highly charged ions indicates that the multiple ionization proceeds via the sequential stripping of electrons.

Original languageEnglish
Article number221003
JournalJournal of Physics B: Atomic, Molecular and Optical Physics
Volume42
Issue number22
DOIs
Publication statusPublished - 2009 Nov 26

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics

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